Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - M. Muralidhar Singh,Ram Krishna,Ch Sateesh Kumar
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The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
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Description
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
More Information
| Author | M. Muralidhar Singh, Ram Krishna, Ch Sateesh Kumar |
|---|---|
| Publisher | Taylor & Francis Ltd |
| Release year | 2024 |
| Cover type | Softcover |
| EAN | 9781032375113 |