Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques - Sebastian Huhn,Rolf Drechsler
-20% with code BOOKS
Shipping in 12-18 days
30-day return policy
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this b ... Full description
You May Also Like
TOP
INCOSE Systems Engineering Handbook
-20% with code BOOKS
In stock at our supplier
TOP
If Anyone Builds It, Everyone Dies: The Case Against Superintelligent AI
Eliezer Yudkowsky, Nate Soares
-20% with code BOOKS
In stock at our supplier
TOP
The Design of Everyday Things
-20% with code BOOKS
In stock at our supplier
TOP
Open Circuits: The Inner Beauty of Electronic Components
Eric Schlaepfer, Windell Oskay
-20% with code BOOKS
In stock at our supplier
TOP
Get started with MicroPython on Raspberry Pi Pico: The Official Raspberry Pi Pico Guide
-20% with code BOOKS
In stock at our supplier
TOP
Practical Electronics for Inventors
-20% with code BOOKS
In stock at our supplier
TOP
Nucleo Boards Programming with the STM32CubeIDE: Hands-on in more than 50 projects
-20% with code BOOKS
In stock at our supplier
TOP
Data-Driven Science and Engineering: Machine Learning, Dynamical Systems, and Control
Steven L. Brunton, J. Nathan Kutz
-20% with code BOOKS
In stock at our supplier
TOP
Fundamentals of Aerodynamics ISE
Christopher Cadou, John D. Anderson
-20% with code BOOKS
In stock at our supplier
TOP
Black Holes: The Key to Understanding the Universe
-20% with code BOOKS
In stock at our supplier
TOP
KiCad Like A Pro - Fundamentals and Projects: Getting started with the world's best open-source PCB tool
-20% with code BOOKS
In stock at our supplier
TOP
How To Read Water: Clues & Patterns from Puddles to the Sea
-20% with code BOOKS
In stock at our supplier
TOP
Foundations of Flavor: The Noma Guide to Fermentation: Including Step-By-Step Information on Making and Cooking with: Koji, Kombuchas, Shoyus, Misos, Vinegars, Garums, Lacto-Ferments and black Fruits Vegetables
-20% with code BOOKS
In stock at our supplier
TOP
Make: Electronics: Learning by Discovery: A hands-on primer for the new electronics enthusiast
-20% with code BOOKS
In stock at our supplier
TOP
The Idea Factory: Bell Labs and the Great Age of American Innovation
-20% with code BOOKS
In stock at our supplier
TOP
Flowers For Algernon: A Modern Literary Classic
-20% with code BOOKS
In stock at our supplier
TOP
Professional SMD Assembly: Practical Low-Cost Methods for Reliable PCB Production
-20% with code BOOKS
In stock at our supplier
TOP
Blood in the Machine: The Origins of the Rebellion Against Big Tech
-20% with code BOOKS
In stock at our supplier
Description
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.
More Information
| Author | Sebastian Huhn, Rolf Drechsler |
|---|---|
| Publisher | Springer Nature Switzerland |
| Release year | 2022 |
| Cover type | Softcover |
| EAN | 9783030692117 |