Digital Integrated Circuit Testing from a Quality Perspective - Eugene R. Hnatek
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Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a
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Description
More Information
| Author | Eugene R. Hnatek |
|---|---|
| Publisher | Springer US |
| Release year | 1993 |
| Cover type | Hardcover |
| EAN | 9780442006433 |