20% off all books with the code: BOOKS
  • check 10+ million books
  • check New arrivals every day
  • check Trusted by 1M+ customers
  • check Great prices & discounts
  • check Shipping across Europe

Electromigration: Studied with the Optical Microscopy Imaging Method - Linghong Li

English
2008-10-10
€73.04 €91.30

-20% with code BOOKS

In stock at our supplier

Shipping in 10-16 days

30-day return policy

Electromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnections. A common method for monitoring interconnection degradation is through electrical resistance measurements, which requires direct electrical contact. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose ... Full description

You May Also Like

Description

Electromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnections. A common method for monitoring interconnection degradation is through electrical resistance measurements, which requires direct electrical contact. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose a novel Optical Microscopy Imaging Method (OMIM), and we provide a theoretical description and experimental results. OMIM not only provides a new method for studying electromigration, but also provides a useful method for studying other micro-devices and materials in a non- contact mode.

More Information

Author Linghong Li
Publisher VDM Verlag
Release year 2008
Cover type Softcover
EAN 9783639088137
Write Your Own Review
You're reviewing: Electromigration: Studied with the Optical Microscopy Imaging Method
Your Rating:

Goodreads Reviews

€73.04 €91.30