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High Resolution X-Ray Diffractometry And Topography - D. K. Bowen,Brian K. Tanner

English
2019-10-10
€157.66 €197.08

-20% with code BOOKS

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Author D. K. Bowen, Brian K. Tanner
Publisher Taylor & Francis Ltd (Sales)
Release year 2019
Cover type Softcover
EAN 9780367400637
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€157.66 €197.08