High Resolution X-Ray Diffractometry And Topography - D. K. Bowen,Brian K. Tanner
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Language
English
Cover
Softcover
Published
2019-10-10
€157.66
€197.08
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Softcover
€197.08
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| Author | D. K. Bowen, Brian K. Tanner |
|---|---|
| Publisher | Taylor & Francis Ltd (Sales) |
| Release year | 2019 |
| Cover type | Softcover |
| EAN | 9780367400637 |
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€157.66
€197.08