PMP®/CAPM® EXAM PREP: A Basic Guide to Activity-On-Node and Critical Path Method - Jayanta K. Das Purkayastha
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A thorough and in-depth preparation guide for PMP® and CAPM® exams covering Precedence Diagramming Method/Activity-On-Node concepts and their analysis using Critical Path Method. This guide explains the concepts with illustrated examples with emphasis on special situations. Explanation of concepts through stepwise solved examples will provide readers hands-on ability for their application. This guide will s ... Full description
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Description
A thorough and in-depth preparation guide for PMP® and CAPM® exams covering Precedence Diagramming Method/Activity-On-Node concepts and their analysis using Critical Path Method. This guide explains the concepts with illustrated examples with emphasis on special situations. Explanation of concepts through stepwise solved examples will provide readers hands-on ability for their application. This guide will serve as a launch pad for advanced study in this area beyond the requirements of the two exams.
More Information
| Author | Jayanta K. Das Purkayastha |
|---|---|
| Publisher | Booklocker.com, Inc. |
| Release year | 2011 |
| Cover type | Softcover |
| EAN | 9781614345046 |