Quantitative Atomic-Resolution Electron Microscopy - Martin Hÿtch,Peter W. Hawkes
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Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low ener ... Full description
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Description
- Contains contributions from leading authorities on the subject matter
- Informs and updates on the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
More Information
| Author | Martin Hÿtch, Peter W. Hawkes |
|---|---|
| Publisher | Elsevier Science |
| Release year | 2021 |
| Cover type | Hardcover |
| EAN | 9780128246078 |