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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - Linda Sawyer,Dale E Newbury,David C Joy,Charles E Lyman,Eric Lifshin,J R Michael,Joseph Goldstein,Patrick Echlin

English
2003-01-31
€158.52 €226.45

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This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron micro ... Full description

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Description

This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition techniques for the elimination of charging in non-conducting specimens are detailed. A data base of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD.

More Information

Author Linda Sawyer, Dale E Newbury, David C Joy, Charles E Lyman, Eric Lifshin, J R Michael, Joseph Goldstein, Patrick Echlin
Publisher Springer Us
Release year 2003
Cover type Hardcover
EAN 9780306472923
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€158.52 €226.45