Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and their Dynamics - Henning Friis Poulsen
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Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored d ... Full description
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Description
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
More Information
| Author | Henning Friis Poulsen |
|---|---|
| Publisher | Springer Berlin Heidelberg |
| Series | Springer Tracts in Modern Physics |
| Release year | 2004 |
| Cover type | Hardcover |
| EAN | 9783540223306 |