Books by Laung-Terng Wang
VLSI Test Principles and Architectures: Design for Testability
Xiaoqing Wen, Cheng-Wen Wu, Laung-Terng Wang
-20% with code BOOKS
In stock at our supplier
System-On-Chip Test Architectures: Nanometer Design for Testability Volume .
Charles E Stroud, Laung-Terng Wang, Nur A Touba
-20% with code BOOKS
In stock at our supplier
VLSI Test Principles and Architectures: Design for Testability
Xiaoqing Wen, Cheng-Wen Wu, Laung-Terng Wang
-20% with code BOOKS
In stock at our supplier