Books by Frontiers in Electronic Testing
Embedded Processor-Based Self-Test
Dimitris Gizopoulos, A. Paschalis, Yervant Zorian
-20% with code BOOKS
In stock at our supplier
Introduction to IDDQ Testing
Paul J. Thadikaran, S. Chakravarty
-20% with code BOOKS
In stock at our supplier
A Designers Guide to Built-In Self-Test
-20% with code BOOKS
In stock at our supplier
Design for AT-Speed Test, Diagnosis and Measurement
-20% with code BOOKS
In stock at our supplier
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
-20% with code BOOKS
In stock at our supplier
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
-20% with code BOOKS
In stock at our supplier
Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard
Nicola Nicolici, Bashir M. Al-Hashimi
-20% with code BOOKS
In stock at our supplier
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
-20% with code BOOKS
In stock at our supplier
Formal Equivalence Checking and Design Debugging
Shi-Yu Huang, Kwang-Ting (Tim) Cheng
-20% with code BOOKS
In stock at our supplier
Research Perspectives and Case Studies in System Test and Diagnosis
-20% with code BOOKS
In stock at our supplier
Boundary-Scan Interconnect Diagnosis
Peter Y. K. Cheung, José T. de Sousa
-20% with code BOOKS
In stock at our supplier
Delay Fault Testing for VLSI Circuits
Kwang-Ting (Tim) Cheng, Angela Krstic
-20% with code BOOKS
In stock at our supplier
Testability Concepts for Digital ICs: The Macro Test Approach
A. P. Thijssen, F. P. M. Beenker, R. G. Bennetts
-20% with code BOOKS
In stock at our supplier
Efficient Branch and Bound Search with Application to Computer-Aided Design
Xinghao Chen, Michael L. Bushnell
-20% with code BOOKS
In stock at our supplier
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications
Wojciech Maly, Jitendra B. Khare
-20% with code BOOKS
In stock at our supplier
Multi-Chip Module Test Strategies
-20% with code BOOKS
In stock at our supplier
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
-20% with code BOOKS
In stock at our supplier
Introduction to Advanced System-on-Chip Test Design and Optimization
-20% with code BOOKS
In stock at our supplier
Elements of STIL: Principles and Applications of IEEE Std. 1450
Gregory A. Maston, Julie N. Villar, Tony R. Taylor
-20% with code BOOKS
In stock at our supplier
Verification by Error Modeling: Using Testing Techniques in Hardware Verification
Zeljko Zilic, Katarzyna Radecka
-20% with code BOOKS
In stock at our supplier
Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
-20% with code BOOKS
In stock at our supplier
Data Mining and Diagnosing IC Fails
-20% with code BOOKS
In stock at our supplier
Advances in Electronic Testing: Challenges and Methodologies
-20% with code BOOKS
In stock at our supplier
Oscillation-Based Test in Mixed-Signal Circuits
Diego Vázquez García de la Vega, José Luis Huertas Díaz, Gloria Huertas Sánchez, Adoración Rueda Rueda
-20% with code BOOKS
In stock at our supplier
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
José Pineda de Gyvez, Manoj Sachdev
-20% with code BOOKS
In stock at our supplier
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
-20% with code BOOKS
In stock at our supplier
Fault Diagnosis of Analog Integrated Circuits
Prithviraj Kabisatpathy, Satyabroto Sinha, Alok Barua
-20% with code BOOKS
In stock at our supplier
Fault-Tolerance Techniques for SRAM-Based FPGAs
Fernanda Lima Kastensmidt, Ricardo Reis
-20% with code BOOKS
In stock at our supplier
Boundary-Scan Interconnect Diagnosis
Peter Y. K. Cheung, José T. de Sousa
-20% with code BOOKS
In stock at our supplier